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Proceedings Paper

Ultraprecision grinding machining of optical aspheric surface in ductile mode
Author(s): Mingjun Chen; Feihu Zhang; Qingliang Zhao; Shen Dong
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Paper Abstract

In this paper, in order to grind optical aspheric surfaces with high quality and high precision, some factors that influence the roughness and profile accuracy of machined surfaces were theoretically analyzed. At the same time, all kinds of parameters of ultra-precision grinding optical aspheric surface in ductile mode were optimized. Afterwards author developed the ultra-precision aspheric grinding system. Its principal axis of the workpiece, traverse guide, longitudinal guide and principal axis of the grinder were aero-static bearing form. Turning accuracy of principal axis of the workpiece was 0.05 micrometers . The highest rotate speed of the grinder was 80000 rev/min. Its turning accuracy was 0.1 micrometers . The resolution of linear displacement of the traverse and longitudinal guide was 4.9 nm. Micro-adjusting accuracy of the center high micro-adjusting machine of the grinder was 0.1 micrometers . Finally, we performed grinding aspheric surface experiments on this grinding system. The results show that to obtain high accuracy and high quality aspheric surface, the mean size of grains of diamond wheels should be smaller than 10 micrometers , and also the high speed of the wheel and small feed rate are needed. After optimizing these grinding parameters, the final machined aspheric profile accuracy can reach 0.4 micrometers and surface roughness can be less than 0.01 micrometers .

Paper Details

Date Published: 27 December 2001
PDF: 9 pages
Proc. SPIE 4451, Optical Manufacturing and Testing IV, (27 December 2001); doi: 10.1117/12.453646
Show Author Affiliations
Mingjun Chen, Harbin Institute of Technology (China)
Feihu Zhang, Harbin Institute of Technology (China)
Qingliang Zhao, Harbin Institute of Technology (China)
Shen Dong, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 4451:
Optical Manufacturing and Testing IV
H. Philip Stahl, Editor(s)

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