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Proceedings Paper

AMSD test error budget sensitivity analysis
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Paper Abstract

The successful augmentation of NASA's X-Ray Cryogenic Facility (XRCF) at the Marshall Space Flight Center (MSFC) to an optical metrology testing facility for the Sub-scale Beryllium Mirror Development (SBMD) and NGST Mirror Sub-scale Development (NMSD) programs required significant modifications and enhancements to achieve useful and meaningful data. In addition to building and integrating both a helium shroud and a rugged and stable platform to support a custom sensor suite, the sensor suite was assembled and integrated to meet the performance requirements for the program. The subsequent evolution from NMSD and SBMD testing to the Advanced Mirror System Demonstrator (AMSD) program is less dramatic in some ways, such as the reutilization of the existing helium shroud and sensor support structure. However, significant modifications were required to meet the AMSD program's more stringent test requirements and conditions resulting in a substantial overhaul of the sensor suite and test plan. This overview paper will discuss the instrumentation changes made for AMSD, including the interferometer selection, null optics, and radius of curvature measurement method. The error budgeting process will be presented, and the overall test plan developed to successfully carry out the tests will be discussed.

Paper Details

Date Published: 27 December 2001
PDF: 12 pages
Proc. SPIE 4451, Optical Manufacturing and Testing IV, (27 December 2001); doi: 10.1117/12.453642
Show Author Affiliations
Patrick J. Reardon, Univ. of Alabama in Huntsville (United States)
James B. Hadaway, Univ. of Alabama in Huntsville (United States)
Joseph M. Geary, Univ. of Alabama in Huntsville (United States)
Bruce R. Peters, Univ. of Alabama in Huntsville (United States)
H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
Ron Eng, NASA Marshall Space Flight Ctr. (United States)
John W. Keidel, NASA Marshall Space Flight Ctr. (United States)
Jeffrey R. Kegley, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 4451:
Optical Manufacturing and Testing IV
H. Philip Stahl, Editor(s)

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