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Proceedings Paper

Use of beam parameters in optical component testing
Author(s): Daniel R. Neal; James K. Gruetzner; James P. Roller
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Paper Abstract

We are investigating the use of a Shack-Hartmann wavefront sensor for measuring optical component quality during manufacture and testing. In a variety of fields, an optical component is designed to pass an optical signal with minimal distortion. Quality control during the manufacturing and production process is a significant concern. Changes in beam parameters, such as RMS wavefront deviation, or the beam quality parameter M2, have been considered as indications of optical component quality. These characteristics can often be quickly determined using relatively simple algorithms and system layouts. A laboratory system has been prepared to investigate the use of a wavefront sensor to measure the quality of an optical component. The instrument provides a simultaneous measure of changes in M2 and induced RMS wavefront error. The results of the investigation are presented.

Paper Details

Date Published: 27 December 2001
PDF: 12 pages
Proc. SPIE 4451, Optical Manufacturing and Testing IV, (27 December 2001); doi: 10.1117/12.453638
Show Author Affiliations
Daniel R. Neal, WaveFront Sciences, Inc. (United States)
James K. Gruetzner, WaveFront Sciences, Inc. (United States)
James P. Roller, WaveFront Sciences, Inc. (United States)

Published in SPIE Proceedings Vol. 4451:
Optical Manufacturing and Testing IV
H. Philip Stahl, Editor(s)

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