Share Email Print

Proceedings Paper

Observation and characterization of the Stierwalt effect in dielectric filters with model coating defects
Author(s): Peter D. Fuqua; James D. Barrie; Nathan Presser
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Many applications of infrared technology require the use of narrow bandpass filters with excellent out-of-band rejection. Frequently, system designs require that the filter be placed in close proximity to a detector or focal plane array. More than twenty-five years ago Donald Stierwalt discovered that some filters that met out-of-band rejection specifications in a spectrophotometer did not meet specification when integrated into a focal plane assembly. In fact, he reported that proximal to the detector, one filter passed three orders of magnitude more out-of-band light. Since then, the Stierwalt Effect has become widely quoted and poorly studied. Many assume that it has to do with scatter in the film, but very little data has been reported. Here, we report the observation of the Stierwalt effect in an optical filter that was seeded with model defects. The seeding was done by depositing sparse 1μm polystyrene spheres upon a clean substrate before sputter depositing a simple band-stop filter. Light rejection from filters prepared in this way showed a strong dependence upon the distance between the film and the detector. Filters deposited without the spheres showed a much smaller effect.

Paper Details

Date Published: 23 January 2003
PDF: 7 pages
Proc. SPIE 4820, Infrared Technology and Applications XXVIII, (23 January 2003); doi: 10.1117/12.453579
Show Author Affiliations
Peter D. Fuqua, The Aerospace Corp. (United States)
James D. Barrie, The Aerospace Corp. (United States)
Nathan Presser, The Aerospace Corp. (United States)

Published in SPIE Proceedings Vol. 4820:
Infrared Technology and Applications XXVIII
Bjorn F. Andresen; Gabor F. Fulop; Marija Strojnik, Editor(s)

© SPIE. Terms of Use
Back to Top