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Proceedings Paper

a-Si:H TFT-driven high-gray-scale contact image sensor with a ground-mesh-type multiplex circuit
Author(s): Ken-ichi Kobayashi; Tsutomu Abe; Hiroyuki Miyake; Hirotsugu Kashimura; Takashi Ozawa; Toshihisa Hamano; Leonard E. Fennell; William D. Turner; Richard L. Weisfield
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Paper Abstract

An A4 page width and 300 dot/inch hydrogenated amorphous silicon thin film transistor (a- Si:H TFT) driven contact image sensor which can read more than 128 gray levels has been developed. Crosstalk due to the coupling between data lines in the multiplex circuit has prevented high gray scale reading. In order to eliminate crosstalk, a sensor with a new multiplex structure has been developed with a ground mesh shield layer inserted at the crossover points between each data line. The ground mesh shield pattern was designed to optimize the gray scale reproduction ratio R. With this sensor, R is more than 0.992 for a single bit, thus achieving 128 levels of gray. This design was compared to the performance of two other sensors, one without a ground mesh shield, the other using a data line meander pattern. This technology is also applicable to higher performance image sensors with greater than 400 dot/inch resolution.

Paper Details

Date Published: 1 June 1991
PDF: 7 pages
Proc. SPIE 1448, Camera and Input Scanner Systems, (1 June 1991); doi: 10.1117/12.45354
Show Author Affiliations
Ken-ichi Kobayashi, Fuji Xerox Co., Ltd. (Japan)
Tsutomu Abe, Fuji Xerox Co., Ltd. (Japan)
Hiroyuki Miyake, Fuji Xerox Co., Ltd. (Japan)
Hirotsugu Kashimura, Fuji Xerox Co., Ltd. (Japan)
Takashi Ozawa, Fuji Xerox Co., Ltd. (Japan)
Toshihisa Hamano, Fuji Xerox Co., Ltd. (Japan)
Leonard E. Fennell, Xerox Palo Alto Research Ctr. (United States)
William D. Turner, Xerox Palo Alto Research Ctr. (United States)
Richard L. Weisfield, Xerox Palo Alto Research Ctr. (United States)


Published in SPIE Proceedings Vol. 1448:
Camera and Input Scanner Systems
Winchyi Chang; James R. Milch, Editor(s)

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