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Proceedings Paper

Material characterization and application of eutectic SbTe-based phase-change optical recording media
Author(s): Michikazu Horie; Takashi Ohno; Natsuko Nobukuni; Kenjirou Kiyono; Takao Hashizume; Masaaki Mizuno
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Paper Abstract

A brief review is described on the material characterization and application of the Ge(Sb70Te30) + Sb alloy. A mechanism to enable fast crystalline growth is discussed based on its single phase, hexagonal crystalline structure. A competitive process of amorphization and re- crystallization during re-solidification is discussed with a simple simulation model, where it is suggested that continuous crystalline growth from the boundary of molten area assures no resolution limit in the formation of amorphous mark edge. Two important concepts of 'enhanced re- crystallization' and '2T-period divided pulse strategy' are proposed to fully utilize this class of material. The enhanced re-crystallization realizes precise amorphous mark size control, realizing high density multi-level recording. The 2T-period divided pulse strategy resolves a pre-mature amorphization issue due to an insufficient cooling period in the case of over 100MHz clock frequency for high speed recording. Finally, it is reported that 120 Mbps digital video recording and over 40GB multi-level recording on CD size single layer are feasible.

Paper Details

Date Published: 10 January 2002
PDF: 12 pages
Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002); doi: 10.1117/12.453380
Show Author Affiliations
Michikazu Horie, Mitsubishi Chemical Corp. (Japan)
Takashi Ohno, Mitsubishi Chemical Corp. (Japan)
Natsuko Nobukuni, Mitsubishi Chemical Corp. (Japan)
Kenjirou Kiyono, Mitsubishi Chemical Corp. (Japan)
Takao Hashizume, Mitsubishi Chemical Corp. (Japan)
Masaaki Mizuno, Mitsubishi Chemical Corp. (Japan)


Published in SPIE Proceedings Vol. 4342:
Optical Data Storage 2001

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