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Proceedings Paper

Subpixel analysis of a double array grating spectrometer
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Paper Abstract

High resolution images can be extracted from a set of differently sampled low resolution images. Usually such a set of images is generated by shifting a detector array device fractions of a pixel or by moving a whole optical system in an appropriate way. Subpixel information is then encoded in the set of taken images. Another way to generate encoded subpixel information is presented in this paper. Multiple fixed images are generated in the optical part of the detector device. The latter method is the method of choice for grating diode array spectrometers. A programmable entrance slit array (MEMS device, mechanical slit positioning system), which replaces the conventional single entrance slit, generates multiple undersampled images of the same spectrum. Every slit is imaged with a different, wavelength dependent imaging scale ratio and a different imaging scale ratio and a different wavelength-aberration-dependency. The subpixel analysis has to take this into account. It is accomplished by a shift-variant superresolution algorithm, a representation of the spectrometer's optical properties and a calibration algorithm which estimates these properties from measured known gas emission spectra. The superresolution algorithm itself is nonlinear and therefore capable of recovering data lost by aberration and pixel integration. An algorithm for subpixel analysis is developed and tested. Theoretical and experimental approaches of the subpixel analysis are presented. The method is proven experimentally on a double array spectrometer. The resolution can be increased up to the factor 7 with seven entrance slits.

Paper Details

Date Published: 17 January 2002
PDF: 11 pages
Proc. SPIE 4480, Imaging Spectrometry VII, (17 January 2002); doi: 10.1117/12.453357
Show Author Affiliations
Andreas Wuttig, Institut fuer Physikalische Hochtechnologie eV Jena (Germany)
Rainer Riesenberg, Institut fuer Physikalische Hochtechnologie eV Jena (Germany)
Guenter Nitzsche, Institut fuer Physikalische Hochtechnologie eV Jena (Germany)


Published in SPIE Proceedings Vol. 4480:
Imaging Spectrometry VII
Michael R. Descour; Sylvia S. Shen, Editor(s)

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