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Proceedings Paper

Notch and large-area CCD imagers
Author(s): Richard A. Bredthauer; Jeff H. Pinter; James R. Janesick; Lloyd B. Robinson
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Paper Abstract

A technique for improving the performance oflarge area high resolution Charge-Coupled Device (CCD) imagers will be described. Adding an additional doped channel down the center of a CCD register provides for charge confinement. This leads to improved charge transfer efficiency and resistance to radiation damage. Two dimenslonal theoretical analysis will be shown along with measured device performance.

Paper Details

Date Published: 1 July 1991
PDF: 6 pages
Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); doi: 10.1117/12.45335
Show Author Affiliations
Richard A. Bredthauer, Loral Aeronutronic (United States)
Jeff H. Pinter, Loral Aeronutronic (United States)
James R. Janesick, Jet Propulsion Lab. (United States)
Lloyd B. Robinson, Lick Observatory/Univ. of California, Santa Cruz (United States)

Published in SPIE Proceedings Vol. 1447:
Charge-Coupled Devices and Solid State Optical Sensors II
Morley M. Blouke, Editor(s)

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