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Proceedings Paper

Application of low-noise CID imagers in scientific instrumentation cameras
Author(s): Joseph Carbone; J. Hutton; Frank S. Arnold; Jeffrey J. Zarnowski; S. VanGorden; Michael J. Pilon; Mark V. Wadsworth
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Paper Abstract

CIDTEC has developed a PC-based instrumentation camera incorporating a preamplifier per row CID imager and a microprocessor/LCA camera controller. The camera takes advantage of CID X-Y addressability to randomly read individual pixels and potentially overlapping pixel subsets in true nondestructive (NDRO) as well as destructive readout modes. Using an oxy- nitride fabricated CID and the NDRO readout technique, pixel full well and noise levels of approximately 1*106 and 40 electrons, respectively, were measured. Data taken from test structures indicates noise levels (which appear to be 1/f limited) can be reduced by a factor of two by eliminating the nitride under the preamplifier gate. Due to software programmability, versatile readout capabilities, wide dynamic range, and extended UV/IR capability, this camera appears to be ideally suited for use in spectroscopy and other scientific applications.

Paper Details

Date Published: 1 July 1991
PDF: 14 pages
Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); doi: 10.1117/12.45327
Show Author Affiliations
Joseph Carbone, CID Technologies Inc. (United States)
J. Hutton, CID Technologies Inc. (United States)
Frank S. Arnold, CID Technologies Inc. (United States)
Jeffrey J. Zarnowski, CID Technologies Inc. (United States)
S. VanGorden, CID Technologies Inc. (United States)
Michael J. Pilon, Univ. of Arizona (United States)
Mark V. Wadsworth, Texas Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 1447:
Charge-Coupled Devices and Solid State Optical Sensors II
Morley M. Blouke, Editor(s)

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