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Proceedings Paper

Performance tests of large CCDs
Author(s): Lloyd B. Robinson; William E. Brown; David Kirk Gilmore; Richard J. Stover; Mingzhi Wei; John C. Geary
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Paper Abstract

Results obtained in fabricating and testing of large CCD image sensors are reported. The emphasis is on high quantum efficiency, excellent charge transfer efficiency at low signal level, large pixel count, low readout noise, and very low dark current. The focus is on the use of the devices for optical astronomy where these parameters are most important. Test results for CCDs fabricated by Ford Aerospace and by EG Experiments to demonstrate the feasibility of a reproducible biased-gate using transparent indium tin oxide as a conducting layer over a silicon oxide insulating layer are discussed. Quantum efficiency of bias-gate thinned CCDs is compared with results obtained from a phosphor-coated front- illuminated CCD.

Paper Details

Date Published: 1 July 1991
PDF: 15 pages
Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); doi: 10.1117/12.45326
Show Author Affiliations
Lloyd B. Robinson, Lick Observatory/Univ. of California, Santa Cruz (United States)
William E. Brown, Univ. of California/Santa Cruz (United States)
David Kirk Gilmore, Lick Observatory/Univ. of California, Santa Cruz (United States)
Richard J. Stover, Lick Observatory/Univ. of California, Santa Cruz (United States)
Mingzhi Wei, Lick Observatory/Univ. of California, Santa Cruz (United States)
John C. Geary, Smithsonian Astrophysical Observatory (United States)


Published in SPIE Proceedings Vol. 1447:
Charge-Coupled Devices and Solid State Optical Sensors II
Morley M. Blouke, Editor(s)

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