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Proceedings Paper

Backside-thinned CCDs for keV electron detection
Author(s): Mihir K. Ravel; Alice L. Reinheimer
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Paper Details

Date Published: 1 July 1991
PDF: 14 pages
Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); doi: 10.1117/12.45318
Show Author Affiliations
Mihir K. Ravel, Tektronix, Inc. (United States)
Alice L. Reinheimer, Tektronix, Inc. (United States)


Published in SPIE Proceedings Vol. 1447:
Charge-Coupled Devices and Solid State Optical Sensors II
Morley M. Blouke, Editor(s)

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