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Proceedings Paper

Effects of proton damage on charge-coupled devices
Author(s): James R. Janesick; George B. Soli; Tom S. Elliott; Stewart A. Collins
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Paper Details

Date Published: 1 July 1991
PDF: 22 pages
Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); doi: 10.1117/12.45317
Show Author Affiliations
James R. Janesick, Jet Propulsion Lab. (United States)
George B. Soli, Jet Propulsion Lab. (United States)
Tom S. Elliott, Jet Propulsion Lab. (United States)
Stewart A. Collins, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 1447:
Charge-Coupled Devices and Solid State Optical Sensors II
Morley M. Blouke, Editor(s)

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