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Proceedings Paper

Optics for coherent x-ray sources
Author(s): Richard H. Pantell; Joseph Feinstein; J. Theodore Cremer; Melvin A. Piestrup; H. Raul Beguiristain; Charles K. Gary
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Paper Abstract

Several laboratories are now in the process of designing and constructing coherent x-ray sources, and application of these beams for radiography and material studies is facilitated by having appropriate optical components to provide collimation or focusing. Control of x-rays can be achieved by employing elements that perform refraction, diffraction or reflection, as exemplified by a lens, grating or mirror, respectively. Of course, the maximum intensity of minimum image size that is obtainable from any of these elements is determined by diffraction effects. Using the parameters of the Liinac Coherent Light Source (LCLS) being studied at the Stanford Synchrotron Radiation Laboratory (SSRL), x-ray optical components can increase the beam intensity approximately eight orders of magnitude and provide submicron images. Performance comparisons are made between the zone plate, the phase zone plate, the compound refractive lens, the Fresnel compound refractive lens, and the parabolic mirror.

Paper Details

Date Published: 28 December 2001
PDF: 10 pages
Proc. SPIE 4500, Optics for Fourth-Generation X-Ray Sources, (28 December 2001); doi: 10.1117/12.452968
Show Author Affiliations
Richard H. Pantell, Stanford Univ. (United States)
Joseph Feinstein, Stanford Univ. (United States)
J. Theodore Cremer, Adelphi Technology Inc. (United States)
Melvin A. Piestrup, Adelphi Technology Inc. (United States)
H. Raul Beguiristain, Adelphi Technology Inc. (United States)
Charles K. Gary, Adelphi Technology Inc. (United States)

Published in SPIE Proceedings Vol. 4500:
Optics for Fourth-Generation X-Ray Sources
Roman O. Tatchyn; Andreas K. Freund; Tadashi Matsushita, Editor(s)

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