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Proceedings Paper

Dynamical diffraction of x-rays under conditions of a rapidly changing structure factor: theory and possible applications for femtosecond x-ray studies
Author(s): Bernhard W. Adams
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Paper Abstract

The diffraction of x-rays in crystalline materials is governed by the amplitudes of the Fourier transform of the electron density, commonly called the structure factors. A change in these amplitudes can be induced by a high-power laser and can lead to a number of interesting effects, like a sweep of the beam propagation direction that could be used for a device for time-resolved x-ray detection that bears some similarity to a streak camera and can potentially reach few-femtosecond resolution. Another effect that becomes relevant on subpicosecond timescales is the generation of frequency-shifted x-rays, which could be used in Mossbauer spectroscopy, or for the concentration of x-ray photons into a narrow energy band. Even small changes in the structure factors can produce a large effect through coherent interaction with the x-rays in a large crystalline volume. A theoretical treatment, based on the Takagi-Taupin theory of dynamical diffraction, is presented.

Paper Details

Date Published: 28 December 2001
PDF: 12 pages
Proc. SPIE 4500, Optics for Fourth-Generation X-Ray Sources, (28 December 2001); doi: 10.1117/12.452957
Show Author Affiliations
Bernhard W. Adams, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 4500:
Optics for Fourth-Generation X-Ray Sources
Roman O. Tatchyn; Andreas K. Freund; Tadashi Matsushita, Editor(s)

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