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Proceedings Paper

Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range
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Paper Abstract

Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range is presented. Performance evaluation based on extinction ratio, throughput, and sensitivity to angular and spectral variations of Si and Ge reflection polarizers are considered.

Paper Details

Date Published: 9 January 2002
PDF: 9 pages
Proc. SPIE 4481, Polarization Analysis and Measurement IV, (9 January 2002); doi: 10.1117/12.452872
Show Author Affiliations
Aed M. El-Saba, Univ. of South Alabama (United States)
Rasheed M. A. Azzam, Univ. of New Orleans (United States)


Published in SPIE Proceedings Vol. 4481:
Polarization Analysis and Measurement IV
Dennis H. Goldstein; David B. Chenault; Walter G. Egan; Michael J. Duggin; Walter G. Egan; Michael J. Duggin, Editor(s)

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