Share Email Print
cover

Proceedings Paper

Improvement of spatial resolution in phase-contrast x-ray computed tomography
Author(s): Atsushi Momose; Ichiro Koyama; Keiichi Hirano
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Image quality of phase-contrast x-ray computed tomogram was evaluated by comparing tomograms obtained by using triple Laue-case x-ray interferometers with a thin or a thick crystal wafer. It was confirmed that the spatial resolution was improved when the wafer is thinned. A simulation study by means of the Takagi-Taupin equation was also carried out for theoretical understanding. According to the wavefront modulation transfer function calculated for Laue-case diffraction, it is suggested that using an interferometer with al thin wafer tends to improve image quality. However, a new problem is pointed out that the accuracy in quantitative measurement of high-frequency phase modulation is not secured even when the wafer is thinned.

Paper Details

Date Published: 7 January 2002
PDF: 11 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452871
Show Author Affiliations
Atsushi Momose, Univ. of Tokyo (Japan)
Ichiro Koyama, Univ. of Tokyo (Japan)
Keiichi Hirano, High Energy Accelerator Research Organization (Japan)


Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

© SPIE. Terms of Use
Back to Top