Share Email Print

Proceedings Paper

X-ray tomographic microscopy at the Swiss Light Source
Author(s): Marco Stampanoni; Peter Wyss; Rafael Abela; Gunther L. Borchert; Detlef Vermeulen; Peter Ruegsegger
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

At the Material Science Beamline 4S of the Swiss Light Source (SLS), the X-ray Tomographic Microscopy (XTM) facility is entering its final construction phase. A high performance detector based on a scintillating screen optically coupled to a CCD camera has been developed and tested. MTF-responses of the detector system show spatial resolution down to the micrometer level. A second detector, which will provide a quantum jump in term of spatial resolution and efficiency, has been successfully simulated and will be integrated in the current device soon. A user- friendly graphical interface gives access to the main measurements parameters needed for a complete tomographic scan in absorption as well as in phase-contrast mode. The new instrumentation shall be used for the analysis of the physical structure and chemical composition of technical materials and biological samples, e.g. enabling non- destructive testing during the development of modern composite materials, or enabling pseudo-dynamic testing of bone samples to establish structure-function relationships in simulated osteoporosis.

Paper Details

Date Published: 7 January 2002
PDF: 12 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452868
Show Author Affiliations
Marco Stampanoni, Univ. Zuerich, ETH Zuerich, and Paul Scherrer Institute (Switzerland)
Peter Wyss, Swiss Federal Labs. for Material Testing and Research (Switzerland)
Rafael Abela, Paul Scherrer Institute (Switzerland)
Gunther L. Borchert, Paul Scherrer Institute and Forschungszentrum Julich GmbH (Germany)
Detlef Vermeulen, Paul Scherrer Institute (Switzerland)
Peter Ruegsegger, Univ. Zuerich (Switerland) and ETH Zuerich (Switzerland)

Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

© SPIE. Terms of Use
Back to Top