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Proceedings Paper

Analytical simulator for Compton tomographic measurements
Author(s): Antonio Brunetti; Bruno Golosio; Roberto Cesareo; Cesare Cappio Borlino
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Paper Abstract

A critical point of several reconstruction and analysis algorithms in x-ray experiments is a fast simulation of the interaction of radiation with matter. This kind of simulation is usually based on Monte Carlo techniques, which follows each particle individual trajectory. Since the maximum number of interactions is a user-definable integer, Monte Carlo simulations allow to obtain an arbitrary precision. However, in several experiments the flux of photons that reach the detector after the interaction in the volume of interest (VOI) is very low, therefore the simulation time may be very large. Simple experiments of x- ray tomography may require several days to obtain reasonable statistics with the faster Monte Carlo codes. Particularly, in x-y scanning tomography both the detector and the x-ray tube are highly collimated. In such cases, conventional Monte Carlo techniques are inadequate. As a possible alternative, we propose an analytical spectrum generator, which evaluates the detected signal through the differential cross section for the single interaction with corrections for absorption of the beam (before the interaction point) and of the scattered photon (after the interaction point). It will be shown that the analytical projector proposed in this paper is several order faster than Monte Carlo based simulators.

Paper Details

Date Published: 7 January 2002
PDF: 8 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452860
Show Author Affiliations
Antonio Brunetti, Univ. di Sassari (Italy)
Bruno Golosio, Univ. di Sassari (Italy)
Roberto Cesareo, Univ. di Sassari (Italy)
Cesare Cappio Borlino, Univ. di Sassari (Italy)

Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

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