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Proceedings Paper

X-ray microtomography of plastics and composite materials
Author(s): Alexander Sasov
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Paper Abstract

Nondestructive information from the internal structure of plastic and composites in natural or adjustable environmental conditions can be obtained by transmission x- ray microscopy. Combination of x-ray microscopy technique with tomographical reconstruction allows getting three- dimensional information about the internal microstructure. A desktop x-ray microscopy-microtomograph SkyScan-1072 has been used in different application areas including plastic, epoxy and metal composite materials and products. The x-ray magnification ranges between 15 and 180. Reconstruction time is near 10 sec per cross section. One of most important application area is composite material where one wants to investigate the 3D structure and reaction to external influences. The system allows obtaining transmission image through the object's materials and to reconstruct nondestructively any cross section or complete internal 3D structure. The sample can be loaded in situ to investigate the reaction of matrix and enforcing structures to external strain. Liquid's absorption and transport through porous materials can be shown directly in three-dimensions. Small details up to 2-3 micrometer in size can be visualized inside the specimen. Software included powerful image processing package to calculate the numerical characteristics of the object's internal microstructure and to create realistic 3D visualization with possibilities of rotation and cutting of reconstructed object into the screen as well as flight simulator for fly through the object microstructure. Microscopical 3D visualization without vacuum and coatings allows displaying the natural specimen structure as well as examine its behavior under external influences (loading, chemical reactions, interaction with other solids, liquids, gases, etc.).

Paper Details

Date Published: 7 January 2002
PDF: 8 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452853
Show Author Affiliations
Alexander Sasov, SkyScan (Belgium)

Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

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