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Proceedings Paper

In-line phase contrast in synchrotron-radiation microradiography and tomography
Author(s): Timm Weitkamp; Christoph Rau; Anatoly A. Snigirev; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; Christian G. Schroer
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Paper Abstract

When used in microimaging, hard x rays from third-generation synchrotron radiation (SR) sources inevitably generate noninterferometric or in-line phase contrast. It is formed by the propagation of a distorted x-ray wavefront after the sample. In this paper, we discuss phase contrast and its properties in two altogether different experimental modes. First, in edge-enhanced microtomography, we show by phase- propagation simulations that local tomography is possible without special effort. The second part of the paper discusses phase contrast and phase artifacts in magnified x- ray imaging and tomography using refractive lenses. Here, the phase effects degrade resolution to a considerable extent. This part of the paper contains experimental results from the ESRF beamline ID 22 in the photon energy range around 20 keV that are compared to simulated images and to experimental results from conventional high-resolution microtomography. The experimental results show that coherence-degrading devices can reduce but not completely eliminate phase effects, and recent microtomography data gathered with an x-ray microscope still cannot beat conventional state-of-the-art high-resolution microtomography with micrometer resolution.

Paper Details

Date Published: 7 January 2002
PDF: 11 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452832
Show Author Affiliations
Timm Weitkamp, European Synchrotron Radiation Facility (France)
Christoph Rau, European Synchrotron Radiation Facility (France)
Anatoly A. Snigirev, European Synchrotron Radiation Facility (France)
Boris Benner, RWTH-Aachen (Germany)
Til Florian Guenzler, RWTH-Aachen (Germany)
Marion Kuhlmann, RWTH-Aachen (Germany)
Christian G. Schroer, RWTH-Aachen (Germany)

Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

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