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Proceedings Paper

Application of an advanced stochastic bottom imaging model for airborne hyperspectral imager data collection
Author(s): Gary D. Gilbert; Lev S. Dolin; Iosif M. Levin; Alexandr G. Luchinin; Stephen E. Stewart
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Paper Abstract

Collection of airborne dat can be an expensive exercise. Data flights should optimize the quality and quantity of the data collected at minimal cost. Although the site to be surveyed is fixed, a mission planner has some freedom in formulating collection strategies. Choices may include the season, the time of day, the altitude and directions of the data run flights, the spectral bands, and the spectral and spatial resolutions used for the survey. A stochastic model has been developed to simulate and quantitatively estimate the statistical performance of airborne hyper- and multi- spectral systems in imaging a littoral sea bottom through a wavy sea surface. Results include mean and variance of various measures of system performance. Candidate collection plans can be tested with the stochastic model. This paper demonstrates the use of the stochastic model in examining the effect of flight direction on the quality of imagery for a variety of zenith sun angles and surface wave conditions. The calculations show the extreme sensitivity of data quality in terms of image signal to noise ratios to flight direction, sun angle, and sea wave direction.

Paper Details

Date Published: 14 January 2002
PDF: 10 pages
Proc. SPIE 4488, Ocean Optics: Remote Sensing and Underwater Imaging, (14 January 2002); doi: 10.1117/12.452831
Show Author Affiliations
Gary D. Gilbert, Space and Naval Warfare Systems Ctr., San Diego (United States)
Lev S. Dolin, Institute of Applied Physics (Russia)
Iosif M. Levin, P. P. Shirshov Institute of Oceanology (Russia)
Alexandr G. Luchinin, Institute of Applied Physics (Russia)
Stephen E. Stewart, Space and Naval Warfare Systems Ctr., San Diego (United States)

Published in SPIE Proceedings Vol. 4488:
Ocean Optics: Remote Sensing and Underwater Imaging
Robert J. Frouin; Robert J. Frouin; Gary D. Gilbert, Editor(s)

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