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Proceedings Paper

Reflectivity of the AL-N coating: results of mechanical and environmental tests
Author(s): Vladimir P. Anisimov; Irina A. Anisimova; Victor A. Kashirin; Kamil A. Moldosanov; Alexander M. Skrynnikov
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Paper Abstract

This paper concerns a behavior of the total hemispherical reflectance (THR) of the Al-N coating in the course of mechanical and environmental tests. The Al-N coating has been designed to reduce the stray sunlight background in the satellite-borne optical instruments and charge-particles-analyzing apparatus operating in open space under intensive solar radiation. Usually, this problem arises when a density of instruments installed on the satellite is high and it is difficult to avoid getting to instrument the light reflected by neighboring devices. Resolution of this problem is also important in connection with development of the extra-atmosphere Far UV astronomy. The THR measurement results are presented for 10 wavelengths wihtin a range from 400 to 927 nm, and also at 121.6 nm, the most intensive line of the solar UV spectrum able to result in considerable contribution to the detector noise in space devices. The samples of the Al-N coating were exposed to standard mechanical loads including the vibratory loads, linear overloads, and impacts, to which the space equipment may be subjected when shipping to the space-vehicle launching site and also when lauching. The samples were also exposed to environmental tests simulating the vacuum, humidity, and cyclic temperature conditions, which may influence the space instruments while shipping, storing, launching, in flight, and under operating conditions. The THR measurements of the samples were made following exposure to each test. The THRs of tested samples at the wavelength of 121.6 nm were as low as 1.5-2%.

Paper Details

Date Published: 22 October 2002
PDF: 8 pages
Proc. SPIE 4780, Surface Scattering and Diffraction for Advanced Metrology II, (22 October 2002); doi: 10.1117/12.452311
Show Author Affiliations
Vladimir P. Anisimov, Institute of Chemistry and Chemical Technologies (Kirgizstan)
Irina A. Anisimova, Institute of Chemistry and Chemical Technologies (Kirgizstan)
Victor A. Kashirin, Special Design Office OKB "Aalam" (Kirgizstan)
Kamil A. Moldosanov, Special Design Office OKB "Aalam" (Kirgizstan)
Alexander M. Skrynnikov, Kyrgyz-Russian Slavic Univ. (Kirgizstan)

Published in SPIE Proceedings Vol. 4780:
Surface Scattering and Diffraction for Advanced Metrology II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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