Share Email Print
cover

Proceedings Paper

Analysis of charge transfer efficiency noise on proton-damaged CCDs for the Hubble Space Telescope Wide Field Camera 3
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Proton induced charge transfer efficiency (CTE) degradation has been studied in the large format charge-coupled device (CCD) flight-like candidates for Wide Field Camera 3 for the Hubble Space Telescope. These detectors were irradiated with different proton fluences. This paper focuses on the statistical nature of CTE degradation due to damage on one of the irradiated devices with exceptional initial CTE characteristics. In radiation damaged CCDs, CTE noise can be the dominant noise component. In contrast to other noise sources, CTE noise has a component of fixed pattern noise that can be removed by the appropriate calibration technique. A large set of data was acquired and analysis of it confirms the expectation that CTE damage is a local phenomenon and it varies widely across the CCD surface. Possible mitigation solutions and their practicality are discussed in some detail.

Paper Details

Date Published: 11 November 2002
PDF: 9 pages
Proc. SPIE 4823, Photonics for Space Environments VIII, (11 November 2002); doi: 10.1117/12.452223
Show Author Affiliations
Scott D. Johnson, NASA Goddard Space Flight Ctr. (United States)
Augustyn Waczynski, NASA Goddard Space Flight Ctr. (United States)
Elizabeth J. Polidan, NASA Goddard Space Flight Ctr. (United States)
Paul W. Marshall, NASA Goddard Space Flight Ctr. (United States)
Robert A. Reed, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 4823:
Photonics for Space Environments VIII
Edward W. Taylor, Editor(s)

© SPIE. Terms of Use
Back to Top