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Proceedings Paper

Si nanostructures embedded in SiO2: electronic and optical properties
Author(s): Stefano Ossicini; Elena Degoli; Marcello Luppi; Rita Magri
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Paper Abstract

We present ab initio results for the structural, electronic and optical properties of silicon nanostructures confined by silicon dioxide. We investigate the role of the dimension, symmetry and bonding situations at the interfaces. In particular we consider Si/SiO2 superlattices and Si nanocrystals embedded in SiO2 matrix. In the case of Si/SiO2 superlattices the presence of oxygen defects at the interface and the dimensionality are the key points in order to explain the experimental outcomes concerning photoluminescence. For Si nanocrystals embedded in SiO2 we show, in agreement with experimental results, the close interplay between chemical and structural effects on the electronic and optical properties.

Paper Details

Date Published: 5 November 2002
PDF: 12 pages
Proc. SPIE 4808, Optical Properties of Nanocrystals, (5 November 2002); doi: 10.1117/12.452043
Show Author Affiliations
Stefano Ossicini, INFM (Italy) and Univ. degli Studi di Modena e Reggio Emilia (Italy)
Elena Degoli, INFM (Italy) and Univ. degli Studi di Modena e Reggio Emilia (Italy)
Marcello Luppi, INFM (Italy) and Univ. degli Studi di Modena e Reggio Emilia (Italy)
Rita Magri, INFM (Italy) and Univ. degli Studi di Modena e Reggio Emilia (Italy)


Published in SPIE Proceedings Vol. 4808:
Optical Properties of Nanocrystals
Zeno Gaburro, Editor(s)

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