Share Email Print
cover

Proceedings Paper

Large-area IR negative luminescent devices
Author(s): Geoff R. Nash; Tim Ashley; Neil T. Gordon; C. L. Jones; C. D. Maxey; R. A. Catchpole
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Negative luminescent (NL) devices, which to an IR observer appear colder than they actually are, have a wide range of possible applications, including for use as IR sources in gas sensing systems and as thermal radiation shields in IR cameras. Additionally these devices can be used as calibration sources for very large IR focal plane arrays and have many potential advantages over conventional calibration sources, including high speed operation and low power consumption. For many of these applications a large area device which displays as large area device which displays as large as possible apparent temperature range is required. However, under reverse bias significant currents are required to reduce the carrier concentrations to the levels needed for maximum dynamic range. We have therefore used a novel micromachining techniqe to fabricate integrated optical concentrators in InSb/InAlSb and HgCdTe NL devices. Smaller area diodes can then be used to achieve the same absorption and the required currents are thus reduced. To fabricate the concentrators, spherical resist masks are first produced by resist reflow. Inductively coupled plasma etchign is then used to alternatley etch the resist mask and the semiconductor, with oxygen and methane/hydrogen respectively, producing concentrators with almost parabolic profiles. Recent results from large area medium wavelength devices with integrated optical concentrators are presented, together with a description of the continuing optimization of the process and progress towards the fabrication of large area long wavelength devices.

Paper Details

Date Published: 23 January 2003
PDF: 8 pages
Proc. SPIE 4820, Infrared Technology and Applications XXVIII, (23 January 2003); doi: 10.1117/12.451968
Show Author Affiliations
Geoff R. Nash, QinetiQ (United Kingdom)
Tim Ashley, QinetiQ (United Kingdom)
Neil T. Gordon, QinetiQ (United Kingdom)
C. L. Jones, BAE SYSTEMS (United Kingdom)
C. D. Maxey, BAE SYSTEMS (United Kingdom)
R. A. Catchpole, BAE SYSTEMS (United Kingdom)


Published in SPIE Proceedings Vol. 4820:
Infrared Technology and Applications XXVIII
Bjorn F. Andresen; Gabor F. Fulop; Marija Strojnik, Editor(s)

© SPIE. Terms of Use
Back to Top