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Proceedings Paper

Superresolution technology for small diffraction spot size in the far field
Author(s): Jia Jia; Changhe Zhou; Wendong Xu; Peng Xi; Liren Liu
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Paper Abstract

In this paper, we use diffractive superresolution technology to design a pure-phase plate for realizing the smaller spot size than the usual Airy spot size. We have calculated 2,3,4,5 circulation zones for optimizing the highest energy compression (Strelratio) with the constraint of the Firstzero value G=0.8. Numerical results show that the 2-circular zone pure-phase plate can yield the highest Strelratio (S=0.59) with the constraint of G=0.8.The 3-circular zone pure-phase plate with the respective phases of φ1φ2φ3 has also been calculated. At the same time the 4,5 circular zone binary phase (0,π) plates are calculated to yield the result of S = 0.57 with G=0.8. The usage of the superresolution phase plate aims to realize the smaller spot size instead of the usage of the higher numerical aperture lens, which is the main advantage of this superresolution technology. Therefore, in this constraint of G=0.8, we have selected the 2-circular zone with binary phase for ease of fabrication. At last, we use a 50 nanometer fiber tip detector to scan the diffractive superresolution light spot in order to compare it with the Airy spot. Detailed experiments are presented.

Paper Details

Date Published: 6 November 2002
PDF: 8 pages
Proc. SPIE 4825, High-Resolution Wavefront Control: Methods, Devices, and Applications IV, (6 November 2002); doi: 10.1117/12.451948
Show Author Affiliations
Jia Jia, Shanghai Institute of Optics and Fine Mechanics (China)
Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Wendong Xu, Shanghai Institute of Optics and Fine Mechanics (China)
Peng Xi, Shanghai Institute of Optics and Fine Mechanics (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 4825:
High-Resolution Wavefront Control: Methods, Devices, and Applications IV
John D. Gonglewski; Mikhail A. Vorontsov; Mark T. Gruneisen; Sergio R. Restaino; Robert K. Tyson, Editor(s)

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