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Proceedings Paper

Power spectral density (PSD) in stitching interferometer
Author(s): Yingjie Yu; Guopei Li
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Paper Abstract

For the optical components in high power laser system, there are some special demands, therefore, there are some peculiar needs in evaluating, for example the testing in middle frequency segment is emphasized. Considering these special demands, power spectral density (PSD) is used as one of the important evaluating parameters. The paper summarizes the meaning of utilizing PSD, its calculation and demarcation methods. For measurement instrument, the paper chooses stitching interferometer to realize the testing of the optics of large scale. In order to test the frequency distortion in stitching, the paper applies PSD as the compared parameter. The results testifies that stitching can not introduce additional frequency distortion.

Paper Details

Date Published: 22 October 2002
PDF: 12 pages
Proc. SPIE 4780, Surface Scattering and Diffraction for Advanced Metrology II, (22 October 2002); doi: 10.1117/12.451843
Show Author Affiliations
Yingjie Yu, Shanghai Univ. (China)
Guopei Li, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 4780:
Surface Scattering and Diffraction for Advanced Metrology II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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