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Proceedings Paper

High-resolution measurement of the free spectral range of an etalon
Author(s): P. Douglas Knight; Alvaro Cruz-Cabrera; Brent C. Bergner
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Paper Abstract

High-resolution measurement of the free spectral range (FSR) for an etalon is becoming more important as greater amounts of information are multiplexed through a single fiber. A method to test the FSR of etalons or etalon based optical components used at telecommunication frequencies is discussed. Slope at a specific point of the etalon response curve is utilized as a means measurement of FSR. The theory that describes how slope, varying as a function of differing etalon signal peaks, can be utilized for the measurement of FSR is developed. This technique has been shown to measure FSR with a resolution of approximately one part in 2000.

Paper Details

Date Published: 25 October 2002
PDF: 4 pages
Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); doi: 10.1117/12.451810
Show Author Affiliations
P. Douglas Knight, Digital Optics Corp. (United States)
Alvaro Cruz-Cabrera, Digital Optics Corp. (United States)
Brent C. Bergner, Digital Optics Corp. (United States)


Published in SPIE Proceedings Vol. 4772:
Electro-Optical System Design, Simulation, Testing, and Training
Richard M. Wasserman; Scott L. DeVore, Editor(s)

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