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Proceedings Paper

Analysis and characterization of surface defects in ophthalmic lenses
Author(s): Josep Mallofre Pladellorens; Jesus Caum; Montserrat Tapias; Cristina Cadevall; Joan Anto; Xavier Fernandez
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Paper Abstract

A device has been designed based on the diffraction that will permit to analyze in an objective and quick form, the quality of ophthalmic lenses. This device situated in the line of production will improve the process of fabrication. The device is based on the phenomenon of the diffraction that takes place in the defects when impacting the light of the laser. The device consists of an optical system, in charge of driving the light of the laser, under good conditions, on the lens to analyze, a sensor, adapted to the wavelength of the laser, that detects the presence of the defect through the produced diffraction and a mechanism in which the lens to inspect is located assures that the laser sweeps the whole surface of the lens. A control system connected to the previous systems regulates the whole process The image obtained can be used to analyze and characterize the type of defect. Using image processing we segment the images in order to classify the defects that appear in the surface of the lens.

Paper Details

Date Published: 22 October 2002
PDF: 8 pages
Proc. SPIE 4780, Surface Scattering and Diffraction for Advanced Metrology II, (22 October 2002); doi: 10.1117/12.451806
Show Author Affiliations
Josep Mallofre Pladellorens, Univ. Politecnica de Catalunya (Spain)
Jesus Caum, Univ. Politecnica de Catalunya (Spain)
Montserrat Tapias, Univ. Politecnica de Catalunya (Spain)
Cristina Cadevall, Univ. Politecnica de Catalunya (Spain)
Joan Anto, Univ. Politecnica de Catalunya (Spain)
Xavier Fernandez, Industrias de Optica, SA (Spain)

Published in SPIE Proceedings Vol. 4780:
Surface Scattering and Diffraction for Advanced Metrology II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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