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Proceedings Paper

Inverse scattering of strongly scattering targets using redundant data sets
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Paper Abstract

For weakly scattering permittivities, each measurement of the scattered far field can be interpreted as a sampling point of the Fourier transformation of the object. Furthermore, each sampling point can be accessed by more than one combination of wavelength, propagation direction, and polarization of the incident field. This means, a set of measurements which access the same sampling point can be regarded as being redundant. For strongly scattering objects the Fourier diffraction slice theorem does not apply. We show that measurements which are redundant in the weakly scattering case can be exploited to resolve difficulties associated with imaging of the strongly scattering objects. One dimensional geometries are investigated to estimate the potential redundant data sets offer for addressing the inverse scattering problem of strongly and multiply scattering objects. In addition, we discuss preliminary results for solving 2D imaging problems.

Paper Details

Date Published: 23 December 2002
PDF: 12 pages
Proc. SPIE 4792, Image Reconstruction from Incomplete Data II, (23 December 2002); doi: 10.1117/12.451794
Show Author Affiliations
Andrey V. Semichaevsky, Univ. of Massachusetts Lowell (United States)
Patrick Ghogomu, Univ. of Massachusetts Lowell (United States)
Nedal Al Ababneh, Univ. of Massachusetts Lowell (United States)
Markus E. Testorf, Univ. of Massachusetts Lowell (United States)
Michael A. Fiddy, Univ. of North Carolina at Charlotte (United States)


Published in SPIE Proceedings Vol. 4792:
Image Reconstruction from Incomplete Data II
Philip J. Bones; Michael A. Fiddy; Rick P. Millane, Editor(s)

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