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Proceedings Paper

Bidirectional calibration results for the cleaning of Spectralon reference panels
Author(s): Nik Anderson; Stuart F. Biggar; Charles J. Burkhart; Kurtis J. Thome; Matt Mavko
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Paper Abstract

The Remote Sensing Group at the University of Arizona uses SpectralonTM (a sintered polytetraflouroethylene-based material) as a white reference source for ground based measurements used in vicarious calibration. These Spectralon panels degrade spectrally and angularly over time due to use in harsh field conditions with their reflectance falling off at shorter wavelengths. This paper examines the effects of sanding on the bi-directional reflectance of Spectralon using measurements in the Remote Sensing Group's calibration lab. The objective is to determine whether the near-Lambertian and spectrally flat nature can be restored through wet sanding with wet/dry sandpaper and de-ionized water. The reference for this method is the hemispherical reflectance of pressed polytetrafluoroethylene (PTFE) powder prepared according to National Institute of Standards and Technology (NIST) directions. The panels and a radiometer are mounted on rotation stages to measure the reflectance factor at different incidence angles for a normal view angle. These measurements are repeated for different panel alignments. Sanding techniques are examined using several grit sizes and strokes.

Paper Details

Date Published: 24 September 2002
PDF: 10 pages
Proc. SPIE 4814, Earth Observing Systems VII, (24 September 2002); doi: 10.1117/12.451780
Show Author Affiliations
Nik Anderson, Optical Sciences Ctr./Univ. of Arizona (United States)
Stuart F. Biggar, Optical Sciences Ctr./Univ. of Arizona (United States)
Charles J. Burkhart, Optical Sciences Ctr./Univ. of Arizona (United States)
Kurtis J. Thome, Optical Sciences Ctr./Univ. of Arizona (United States)
Matt Mavko, Optical Sciences Ctr./Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 4814:
Earth Observing Systems VII
William L. Barnes, Editor(s)

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