Proceedings Paper
Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10 K to 295 K| Format | Member Price | Non-Member Price |
|---|---|---|
| $14.40 | $18.00 |
Paper Abstract
We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm-1 to 10000 cm-1 wavenumber range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm-1 and temperature-dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of <10-5 is used for polarization selection. The uncertainties in the fringe-counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.
Paper Details
Date Published: 25 November 2002
PDF: 10 pages
Proc. SPIE 4822, Cryogenic Optical Systems and Instruments IX, (25 November 2002); doi: 10.1117/12.451770
Published in SPIE Proceedings Vol. 4822:
Cryogenic Optical Systems and Instruments IX
James B. Heaney; Lawrence G. Burriesci, Editor(s)
PDF: 10 pages
Proc. SPIE 4822, Cryogenic Optical Systems and Instruments IX, (25 November 2002); doi: 10.1117/12.451770
Show Author Affiliations
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Michael E. Thomas, Johns Hopkins Univ. (United States)
Published in SPIE Proceedings Vol. 4822:
Cryogenic Optical Systems and Instruments IX
James B. Heaney; Lawrence G. Burriesci, Editor(s)
© SPIE. Terms of Use
