Share Email Print
cover

Proceedings Paper

Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10 K to 295 K
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm-1 to 10000 cm-1 wavenumber range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm-1 and temperature-dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of <10-5 is used for polarization selection. The uncertainties in the fringe-counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.

Paper Details

Date Published: 25 November 2002
PDF: 10 pages
Proc. SPIE 4822, Cryogenic Optical Systems and Instruments IX, (25 November 2002); doi: 10.1117/12.451770
Show Author Affiliations
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Michael E. Thomas, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 4822:
Cryogenic Optical Systems and Instruments IX
James B. Heaney; Lawrence G. Burriesci, Editor(s)

© SPIE. Terms of Use
Back to Top