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Proceedings Paper

Testing system of photo detector of PIN photodiode
Author(s): Rongguo Fu; Benkang Chang; Yunsheng Qian; Yuan Zhi Zong; Qi Hai Zhan
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Paper Abstract

The paper designs a set of system for measuring the responding characteristic of detector of PIN photon diode. The paper introduces the principle and structure of the PIN diode detector, and then describes the researching background and the responding characteristic of the detector. The detailed designing plan is given, and the step of implement is brought out. The system is composed of three subsystems. The first is optical system. The optical system can produce a laser of 1.06μm with a certain frequency and energy, with the aid of light source and CCD camera, the laser beam can focus on the surface of the photon detector of PIN diode. The second is signal-testing system. It can measure the responding characteristic of the photon detector, and the average noise power. The third is temperature control system. The responding characteristic of the photon detector in the high temperature and low temperature can be obtained with the temperature-control device. All the data is recorded and analyzed by the computer. At last, the paper provides the structure of the system and the testing result of the photon detector.

Paper Details

Date Published: 25 October 2002
PDF: 11 pages
Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); doi: 10.1117/12.451767
Show Author Affiliations
Rongguo Fu, Nanjing Univ. of Science and Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)
Yunsheng Qian, Nanjing Univ. of Science and Technology (China)
Yuan Zhi Zong, Nanjing Univ. of Science and Technology (China)
Qi Hai Zhan, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 4772:
Electro-Optical System Design, Simulation, Testing, and Training
Richard M. Wasserman; Scott L. DeVore, Editor(s)

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