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Proceedings Paper

Calculation for effects of temperature fluctuation noise on NETD in uncooled infrared thermal imaging system
Author(s): Lei Liu; Benkang Chang
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Paper Abstract

It has been known for some time that the technology of the uncooled infrared thermal imaging system could provide a low-cost, compact-structure, low-power consumption thermal imaging device. This paper describes the theoretic limitation modal of the uncooled thermal imager's performance; temperature fluctuation noise limit is explored and presented. NETD affected by the detector structure and the noise is calculated theoretically. The theoretical curves of the relation between NETD and detector temperature, background temperature, thermal conductance and the area of the pixel are presented.

Paper Details

Date Published: 25 October 2002
PDF: 7 pages
Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); doi: 10.1117/12.451754
Show Author Affiliations
Lei Liu, Nanjing Univ. of Science and Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 4772:
Electro-Optical System Design, Simulation, Testing, and Training
Richard M. Wasserman; Scott L. DeVore, Editor(s)

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