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Proceedings Paper

X-ray spectroscopy and calibrations in the 50- to 60-keV range
Author(s): John F. Seely; Lawrence T. Hudson; James L. Weaver; Glenn E. Holland; Craig Nelson Boyer
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Paper Abstract

Spectrometers have been developed to record x-ray spectra in the energy range 50 eV to 60 keV. The dispersion elements are transmission crystals for energies higher than approximately 10 keV, reflection crystals for 1 keV to 20 keV, and transmission gratings for energies less than 1 keV. The two-dimensional spectral images are recorded on a CCD or CMOS sensor with a phosphor conversion screen. Silicon photodiodes are positioned in front of the 2D sensor to provide absolute x-ray flux calibrations. The diodes have 1 mm2 area and sub-nanosecond time response. The diodes, transmission gratings, and attenuation filters were absolutely calibrated using synchrotron radiation. In addition, the diodes were calibrated in pulsed mode using the soft x-ray (70 eV to 250 eV) pulses from individual electron bunches circulating in the synchrotron storage ring, and a self-calibration model extends the calibration to higher energy. X-ray and extreme ultraviolet spectra were recorded at the OMEGA and NIKE laser facilities. A hard x-ray spectrometer is being built for the National Ignition Facility (NIF) that covers the 1 keV to 20 keV range with one transmission crystal channel and four reflection crystal channels.

Paper Details

Date Published: 26 November 2002
PDF: 6 pages
Proc. SPIE 4786, Penetrating Radiation Systems and Applications IV, (26 November 2002); doi: 10.1117/12.451750
Show Author Affiliations
John F. Seely, Naval Research Lab. (United States)
Lawrence T. Hudson, National Institute of Standards and Technology (United States)
James L. Weaver, Naval Research Lab. (United States)
Glenn E. Holland, SFA, Inc. (United States)
Craig Nelson Boyer, Universities Space Research Association (United States)

Published in SPIE Proceedings Vol. 4786:
Penetrating Radiation Systems and Applications IV
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Lisa J. Porter; Edward J. Morton, Editor(s)

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