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Proceedings Paper

Application of Shack-Hartmann wavefront sensing technology to transmissive optic metrology
Author(s): Ron R. Rammage; Daniel R. Neal; Richard J. Copland
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Paper Abstract

Human vision correction optics must be produced in quantity to be economical. At the same time every human eye is unique and requires a custom corrective solution. For this reason the vision industries need fast, versatile and accurate methodologies for characterizing optics for production and research. Current methods for measuring these optics generally yield a cubic spline taken from less than 10 points across the surface of the lens. As corrective optics have grown in complexity this has become inadequate. The Shack-Hartmann wavefront sensor is a device that measures phase and irradiance of light in a single snapshot using geometric properties of light. Advantages of the Shack-Hartmann sensor include small size, ruggedness, accuracy, and vibration insensitivity. This paper discusses a methodology for designing instruments based on Shack-Hartmann sensors. The method is then applied to the development of an instrument for accurate measurement of transmissive optics such as gradient bifocal spectacle lenses, progressive addition bifocal lenses, intrarocular devices, contact lenses, and human corneal tissue. In addition, this instrument may be configured to provide hundreds of points across the surface of the lens giving improved spatial resolution. Methods are explored for extending the dynamic range and accuracy to meet the expanding needs of the ophthalmic and optometric industries. Data is presented demonstrating the accuracy and repeatability of this technique for the target optics.

Paper Details

Date Published: 11 November 2002
PDF: 12 pages
Proc. SPIE 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, (11 November 2002); doi: 10.1117/12.451734
Show Author Affiliations
Ron R. Rammage, WaveFront Sciences, Inc. (United States)
Daniel R. Neal, WaveFront Sciences, Inc. (United States)
Richard J. Copland, WaveFront Sciences, Inc. (United States)

Published in SPIE Proceedings Vol. 4779:
Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
Angela Duparré; Bhanwar Singh, Editor(s)

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