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Proceedings Paper

Time-frequency domain reflectometry for smart wiring systems
Author(s): Yong-June Shin; Eun-Seok Song; Joo-Won Kim; Jin-Bae Park; Jong-Gwan Yook; Edward J. Powers
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Paper Abstract

In this paper, a new high resolution reflectometry scheme, time-frequency domain reflectometry, is proposed to detect and locate a fault in wiring. Traditional reflectometry methods have been achieved in either the time domain or frequency domain only. However, time-frequency domain reflectometry utilizes time and frequency information of a transient signal to detect and locate the fault. The time-frequency domain reflectometry approach described in this paper is characterized by time-frequency reference signal design and post-processing of the reference and reflected signals to detect and locate the fault. Using a computational electromagnetic model of a coaxial cable with a fault, time-frequency domain reflectometry has been demonstrated. Knowledge of time and frequency localized information for the reference and reflected signal gained via time-frequency analysis, allows one to detect the fault and estimate the location accurately.

Paper Details

Date Published: 6 December 2002
PDF: 10 pages
Proc. SPIE 4791, Advanced Signal Processing Algorithms, Architectures, and Implementations XII, (6 December 2002); doi: 10.1117/12.451709
Show Author Affiliations
Yong-June Shin, Univ. of Texas/Austin (United States)
Eun-Seok Song, Yonsei Univ. (South Korea)
Joo-Won Kim, Yonsei Univ. (South Korea)
Jin-Bae Park, Yonsei Univ. (South Korea)
Jong-Gwan Yook, Yonsei Univ. (South Korea)
Edward J. Powers, Univ. of Texas/Austin (United States)

Published in SPIE Proceedings Vol. 4791:
Advanced Signal Processing Algorithms, Architectures, and Implementations XII
Franklin T. Luk, Editor(s)

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