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Proceedings Paper

Local recovery of reflectance and illumination spectra
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Paper Abstract

We present a method for separating a sensor radiance spectrum into a reflectance spectrum and an illumination spectrum. The method is based on the use of subspace models for both reflectance and illumination spectra. The method exploits the fact that reflectance and illumination spectra typically lie in distinct subspaces. The separation algorithm finds the best reflectance and illumination spectra within their respective subspaces. We have applied the algorithm to simulated VNIR radiance spectra using a large database of reflectance and illumination spectra. We have also examined the use of the recovered reflectance spectra for material identification over a database of materials.

Paper Details

Date Published: 8 November 2002
PDF: 10 pages
Proc. SPIE 4816, Imaging Spectrometry VIII, (8 November 2002); doi: 10.1117/12.451697
Show Author Affiliations
Kartik Chandra, Univ. of California/Irvine (United States)
Glenn Healey, Univ. of California/Irvine (United States)


Published in SPIE Proceedings Vol. 4816:
Imaging Spectrometry VIII
Sylvia S. Shen, Editor(s)

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