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Proceedings Paper

A new hard x-ray diffractometer (100 to 400 keV) for bulk crystalline analysis: applications for nondestructive investigation
Author(s): Bernard Hamelin; Pierre Bastie
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Paper Abstract

The characterization in the bulk of crystalline thick materials (thickness: several cm) can be performed up to now by using high energy X-Ray sources (gamma ray diffractometers or high energy beamlines of synchrotron facilities) or with neutron beams. The Institut Laue-Langevin has developed and built in collaboration with the Laboratoire de Spectrométrie Physique, a new instrument using the continuous high energy X-ray spectrum (100 - 400 keV) delivered by a high voltage, fine focus X-ray generator, previously used for industrial radiography. This article describes the principle of this new diffractometer and presents an overview of the main applications in the field of non destructive crystalline characterization, for both physic researches and industrial applications.

Paper Details

Date Published: 26 November 2002
PDF: 11 pages
Proc. SPIE 4786, Penetrating Radiation Systems and Applications IV, (26 November 2002); doi: 10.1117/12.451609
Show Author Affiliations
Bernard Hamelin, Institut Laue-Langevin (France)
Pierre Bastie, Univ. Joseph Fourier (France)


Published in SPIE Proceedings Vol. 4786:
Penetrating Radiation Systems and Applications IV
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Lisa J. Porter; Edward J. Morton, Editor(s)

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