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Proceedings Paper

Periodic sine structures on dielectric surface: numerical calculations and applications
Author(s): Vitali E. Gruzdev; Anastasia S. Gruzdeva
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Paper Abstract

Finite-difference time-domain technique of numerical modeling is applied to investigate scattering of plane linearly polarized monochromatic wave by sinc variations of dielectric surface relief. Results of modeling include 1) space distribution of scattered light, 2) dependence of field amplification on ratio of roughness amplitude to laser wavelength, and 3) dependence of field amplification on ratio of roughness period to laser wavelength. Obtained results show that for TE polarization a)transmitted signal is more sensitive to roughness parameters than reflected one, b) there is narrow resonance in dependence of amplitude of scattered field on laser wavelength and roughness period, c) dependence of amplitude of scattered field on roughness amplitude is described by parabolic function for small values of relief amplitude. Depending on relief amplitude and period, scattering by sine roughness can result in formation of inhomogeneous space field distribution consisting of periodic field maxima inside dielectric or formation of homogeneous distribution such that both transmitted and reflected signals are close to plane wave. We consider the following applications of obtained results: 1) possibility to develop a new technique for in-situ surface roughness characterization, 2) possible mechanisms of feedbacks during laser-induced formation of surface ripples, and 3) anti-reflection effect.

Paper Details

Date Published: 26 December 2001
PDF: 12 pages
Proc. SPIE 4438, Physics, Theory, and Applications of Periodic Structures in Optics, (26 December 2001); doi: 10.1117/12.451494
Show Author Affiliations
Vitali E. Gruzdev, S.I. Vavilov State Optical Institute (Russia)
Anastasia S. Gruzdeva, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 4438:
Physics, Theory, and Applications of Periodic Structures in Optics
Philippe Lalanne, Editor(s)

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