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Proceedings Paper

Comparison between diffraction intensity for different planar geometries
Author(s): Mario Marcelo Lehman; Carlos I. Aguirre-Velez
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Paper Abstract

We study the properties of the self-similarity function for the intensity distribution of field when different types of gratings, fractal, periodic and aleatory, are used. For this we introduce some definitions considering different points of view that allows us the construction of the diffraction gratings with each geometry. Such structures are applied for the calculation of the electromagnetic field propagation in the Fresnel and Fraunhofer regions.

Paper Details

Date Published: 21 December 2001
PDF: 12 pages
Proc. SPIE 4436, Wave-Optical Systems Engineering, (21 December 2001); doi: 10.1117/12.451296
Show Author Affiliations
Mario Marcelo Lehman, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Carlos I. Aguirre-Velez, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)

Published in SPIE Proceedings Vol. 4436:
Wave-Optical Systems Engineering
Frank Wyrowski, Editor(s)

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