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Proceedings Paper

Intense ion beams accelerated by relativistic laser plasmas
Author(s): Markus Roth; Thomas E. Cowan; Jean-Claude J. Gauthier; Matthew Allen; Patrick Audebert; Abel Blazevic; Julien Fuchs; Matthias Geissel; Manuel Hegelich; S. Karsch; Jurgen Meyer-ter-Vehn; Alexander Pukhov; Theodor Schlegel
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Paper Abstract

We have studied the influence of the target properties on laser-accelerated proton and ion beams generated by the LULI multi-terawatt laser. A strong dependence of the ion emission on the surface conditions, conductivity, shape and material of the thin foil targets were observed. We have performed a full characterization of the ion beam using magnetic spectrometers, Thompson parabolas, radiochromic film and nuclear activation techniques. The strong dependence of the ion beam acceleration on the conditions on the target back surface was found in agreement with theoretical predictions based on the target normal sheath acceleration (TNSA) mechanism. Proton kinetic energies up to 25 MeV have been observed.

Paper Details

Date Published: 21 December 2001
PDF: 6 pages
Proc. SPIE 4510, Charged Particle Detection, Diagnostics, and Imaging, (21 December 2001); doi: 10.1117/12.451281
Show Author Affiliations
Markus Roth, Gesellschaft fuer Schwerionenforschung mbH (Germany)
Thomas E. Cowan, General Atomics (United States)
Jean-Claude J. Gauthier, Ecole Polytechnique (France)
Matthew Allen, General Atomics (United States)
Patrick Audebert, Ecole Polytechnique (France)
Abel Blazevic, Gesellschaft fuer Schwerionenforschung mbH (Germany)
Julien Fuchs, Ecole Polytechnique (France)
Matthias Geissel, Gesellschaft fuer Schwerionenforschung mbH (Germany)
Manuel Hegelich, Max-Planck-Institut fuer Quantenoptik (Germany)
S. Karsch, Max-Planck-Institut fuer Quantenoptik (Germany)
Jurgen Meyer-ter-Vehn, Max-Planck-Institut fuer Quantenoptik (Germany)
Alexander Pukhov, Max-Planck-Institut fuer Quantenoptik (Germany)
Theodor Schlegel, Gesellschaft fuer Schwerionenforschung mbH (Germany)


Published in SPIE Proceedings Vol. 4510:
Charged Particle Detection, Diagnostics, and Imaging
Eric Munro; John A. Rouse, Editor(s)

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