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Proceedings Paper

Development of a two-dimensional focusing faceted x-ray analyzer
Author(s): Harald Sinn; Nicolai A. Moldovan; Ayman H. Said; Ercan E. Alp
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Paper Abstract

We present a new concept for an X-ray analyzer for meV-spectroscopy with hard X-rays in the range of 20 keV. The analyzer consists of a 5"-diameter planar glass disk with about 8000 silicon crystal pixels glued to it. With a spherical bender it is bent to a radius of 6 m. The slope error over a 4"-diameter area is about 0.8 μm RMS. Used in a spectrometer for inelastic X-ray scattering as an analyzer, an overall energy resolution of 1.0 meV at 25.7 keV and of 1.8 meV at 21.6 keV is obtained.

Paper Details

Date Published: 21 November 2002
PDF: 8 pages
Proc. SPIE 4783, Design and Microfabrication of Novel X-Ray Optics, (21 November 2002); doi: 10.1117/12.451185
Show Author Affiliations
Harald Sinn, Argonne National Lab. (United States)
Nicolai A. Moldovan, Argonne National Lab. (United States)
Ayman H. Said, Argonne National Lab. (United States)
Ercan E. Alp, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 4783:
Design and Microfabrication of Novel X-Ray Optics
Derrick C. Mancini, Editor(s)

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