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Proceedings Paper

Scanning transmission soft x-ray microscopy at beamline X-1A at the NSLS: advances in instrumentation and selected applications
Author(s): Michael Feser; Tobias Beetz; Chris J. Jacobsen; Janos Kirz; Sue Wirick; Aaron Stein; Thorsten Schaefer
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Paper Abstract

Soft x-ray scanning transmission x-ray microscopy allows one to image dry and wet environmental science, biological, polymer, and geochemical specimens on a nanoscale. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Recent results on Nomarski differential phase contrast and first results on investigations at the oxygen K edge and iron L edge of hydrous ferric oxide transformations are presented.

Paper Details

Date Published: 20 December 2001
PDF: 8 pages
Proc. SPIE 4506, Soft X-Ray and EUV Imaging Systems II, (20 December 2001); doi: 10.1117/12.450955
Show Author Affiliations
Michael Feser, SUNY/Stony Brook (United States)
Tobias Beetz, SUNY/Stony Brook (United States)
Chris J. Jacobsen, SUNY/Stony Brook (United States)
Janos Kirz, SUNY/Stony Brook (United States)
Sue Wirick, SUNY/Stony Brook (United States)
Aaron Stein, SUNY/Stony Brook (United States)
Thorsten Schaefer, SUNY/Stony Brook and Forschungszentrum Karlsruhe (Germany)

Published in SPIE Proceedings Vol. 4506:
Soft X-Ray and EUV Imaging Systems II
Daniel A. Tichenor; James A. Folta, Editor(s)

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