Share Email Print
cover

Proceedings Paper

Direct observations of metal support interaction in nano-scale systems
Author(s): Robert F. Klie; Kai Sun; Mark M. Disko; J. Liu; N. D. Browning
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, we will describe the experimental processes involved in analytical atomic-resolution scanning transmission electron microscopy (STEM) of supported nano-scale systems. We show that the combination of high-resolution Z-contrast imaging and electron energy loss spectroscopy (EELS) provides an analytical tool with unprecedented chemical and spatial sensitivity that is vital for studying interfaces in heterogeneous catalyst systems. We apply the described methods to study two example heterogeneous catalyst systems: Pt/SiO2, and Cu/Al2O3. In particular, the presence of a few monolayers of platinum oxide in Pt/SiO2 can be clearly seen, and changes in the chemistry of the SiO2 support within ~1 nm of the metal-oxide interface can be characterized as a function of the catalyst preparation conditions. The Cu/Al2O3, reduced at various temperatures, exhibits an increasing oxidation of the Cu-particles upon higher temperature reduction.

Paper Details

Date Published: 15 November 2002
PDF: 12 pages
Proc. SPIE 4807, Physical Chemistry of Interfaces and Nanomaterials, (15 November 2002); doi: 10.1117/12.450936
Show Author Affiliations
Robert F. Klie, Univ. of Illinois/Chicago (United States)
Kai Sun, Univ. of Illinois/Chicago (United States)
Mark M. Disko, ExxonMobil Research & Engineering Co. (United States)
J. Liu, Monsanto Co. (United States)
N. D. Browning, Univ. of Illinois/Chicago (United States)


Published in SPIE Proceedings Vol. 4807:
Physical Chemistry of Interfaces and Nanomaterials
Jin Z. Zhang; Zhong L. Wang, Editor(s)

© SPIE. Terms of Use
Back to Top