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Proceedings Paper

Optical performance characterization of AWG devices using low-coherence interferometer
Author(s): Dongqing Cao; Ming Yan; Brian McGinnis; Tony J. Ticknor; Jane C. Lam; Wei Chen; Yung-Jui Chen
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Paper Abstract

An optical low coherence interferometer was built and used to characterize the optical performance of planar arrayed-waveguide grating (AWG) devices. The phase error and amplitude distributions of individual waveguides in an AWG were extracted by sectioning individual interferograms from the low coherence interferometer. Using a large amount of oversampling to improve signal-to-noise in combination with Hilbert transformation method, phase errors of less than λ/300 in our AWG’s were achieved and correlated to fabrication variations from the waveguide device design. This was subsequently used to improve the performance of our devices. In addition, the group delay (GD) and chromatic dispersion (CD) were also derived from the measured phase error using a Fourier transform method. The derived GD and CD matched well with those directly measured from commercial chromatic dispersion equipment based on the phase modulation method. The relationship between the phase and amplitude errors with different frequencies and the variation of GD or CD will be discussed.

Paper Details

Date Published: 25 November 2002
PDF: 7 pages
Proc. SPIE 4805, Design and Fabrication of Planar Optical Waveguide Devices and Materials, (25 November 2002); doi: 10.1117/12.450904
Show Author Affiliations
Dongqing Cao, Lightwave Microsystems Corp. (United States)
Ming Yan, Lightwave Microsystems Corp. (United States)
Brian McGinnis, Lightwave Microsystems Corp. (United States)
Tony J. Ticknor, Lightwave Microsystems Corp. (United States)
Jane C. Lam, Lightwave Microsystems Corp. (United States)
Wei Chen, Univ. of Maryland/Baltimore (United States)
Yung-Jui Chen, Univ. of Maryland/Baltimore (United States)


Published in SPIE Proceedings Vol. 4805:
Design and Fabrication of Planar Optical Waveguide Devices and Materials
Robert A. Norwood, Editor(s)

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