Share Email Print
cover

Proceedings Paper

Shack-Hartmann wavefront sensor precision and accuracy
Author(s): Daniel R. Neal; James Copland; David A. Neal
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The design of a wavefront sensor may be determined by the lenslet array and camera selection. There are numerous different applications for these sensors, requiring widely differing dynamic range and accuracy. Performance metrics are needed to evaluate candidate designs and to compare results. We have developed a standard methodology for measuring the repeatability, accuracy and dynamic range of different wavefront sensor designs, and have experimentally applied these metrics to a number of different sensors.

Paper Details

Date Published: 11 November 2002
PDF: 13 pages
Proc. SPIE 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, (11 November 2002); doi: 10.1117/12.450850
Show Author Affiliations
Daniel R. Neal, WaveFront Sciences, Inc. (United States)
James Copland, WaveFront Sciences, Inc. (United States)
David A. Neal, WaveFront Sciences, Inc. (United States)


Published in SPIE Proceedings Vol. 4779:
Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
Angela Duparré; Bhanwar Singh, Editor(s)

© SPIE. Terms of Use
Back to Top