Share Email Print

Proceedings Paper

Electrical properties of polycrystalline mercuric iodide x-ray detectors
Author(s): Haim Hermon; Robert A. Street; Leonid Melekhov; Asaf Zuck; Alexander I. Vilensky; Steve E. Ready; George Zentai; Michael M. Schieber; Larry D. Partain
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

New results for polycrystalline HgI2 detectors are reported here. Due to its decent electrical properties and high stopping power for X-rays and gamma rays, HgI2 is a good candidate for many medical imaging applications. HgI2 were deposited by a hot wall Physical Vapor Deposition (PVD) method, and the electrical properties of the films, including X-ray response and dark current data are reported. Results of imaging capabilities and spatial resolution obtained by polycrystalline HgI2 deposited onto a 2'x2' TFT imaging array on an amorphous silicon substrate are also given. These tests were carried out at Xerox-PARC Research Center.

Paper Details

Date Published: 19 December 2001
PDF: 8 pages
Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); doi: 10.1117/12.450792
Show Author Affiliations
Haim Hermon, Real-Time Radiography Ltd. (Israel)
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Leonid Melekhov, Real-Time Radiography Ltd. (Israel)
Asaf Zuck, Real-Time Radiography Ltd. (Israel)
Alexander I. Vilensky, Real-Time Radiography Ltd. (Israel)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)
George Zentai, Ginzton Technology Ctr. (United States)
Michael M. Schieber, Real Time Radiography Ltd. (Israel)
Larry D. Partain, Ginzton Technology Ctr. (United States)

Published in SPIE Proceedings Vol. 4508:
Penetrating Radiation Systems and Applications III
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Richard C. Schirato; Edward J. Morton, Editor(s)

© SPIE. Terms of Use
Back to Top