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Proceedings Paper

Direct-conversion x-ray imaging detectors for medical nondestructive testing (NDT) and other applications
Author(s): Denny L. Y. Lee; Kelly P. Golden; Jeffrey G. Yorker; Brian G. Rodricks; Lawrence K. Cheung; Lothar S. Jeromin
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Paper Abstract

Direct conversion of x-ray energy into electrical charge has been extensively developed into imaging products in the past few years. Applications include general radiography, mammography, x-ray crystallography, portal imaging, and non-destructive testing. Direct methods avoid intermediate conversion of x-rays into light prior to generating a measurable electrical charge. This eliminates light scattering effects on image sharpness, allowing detectors to be designed to the limit of the theoretical modulation transfer function for a discrete-pixel sensor. Working exposure range can be customized by adjusting bias and thickness of sensor layers in coordination with readout-electronics specifications. Mature amorphous selenium technology and recent progress on high-quality Thin-Film Transistor (TFT) arrays for computer displays have allowed development of practical large-area high-resolution flat-panel x-ray imaging systems. A variety of design optimizations enable direct-conversion technology to satisfy a wide range of applications.

Paper Details

Date Published: 19 December 2001
PDF: 14 pages
Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); doi: 10.1117/12.450782
Show Author Affiliations
Denny L. Y. Lee, Direct Radiography Corp. (United States)
Kelly P. Golden, Direct Radiography Corp. (United States)
Jeffrey G. Yorker, Direct Radiography Corp. (United States)
Brian G. Rodricks, Direct Radiography Corp. (United States)
Lawrence K. Cheung, Direct Radiography Corp. (United States)
Lothar S. Jeromin, Direct Radiography Corp. (United States)


Published in SPIE Proceedings Vol. 4508:
Penetrating Radiation Systems and Applications III
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Richard C. Schirato; Edward J. Morton, Editor(s)

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