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Proceedings Paper

Application of new five-channel x-ray/EUV spectrometer with an imaging transmission diffraction grating for study of z-pinch plasma sources
Author(s): Dmitry A. Fedin; Victor L. Kantsyrev; Bruno S. Bauer; Stephan Fuelling; Sean Keely; Hank LeBeau; Gene Newman; Wade Cline
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Paper Abstract

A new five-channel spectrometer is designed for registration of x-ray spectral line emissions from plasmas with temporal resolution. All channels are independent from each other and include wide variety of dispersing elements (crystals and/or multiplayer mirrors) and detectors (Si-diodes or PCD). Sixth channel is used for device alignments with minimum adjustments can be used as channel for transmission diffraction grating spectrometer or channel for another time resolved detector. The device was used in experiments with different plasma sources in different configurations and showed its reliability and flexibility.

Paper Details

Date Published: 18 December 2001
PDF: 7 pages
Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); doi: 10.1117/12.450765
Show Author Affiliations
Dmitry A. Fedin, Univ. of Nevada/Reno (United States)
Victor L. Kantsyrev, Univ. of Nevada/Reno (United States)
Bruno S. Bauer, Univ. of Nevada/Reno (United States)
Stephan Fuelling, Univ. of Nevada/Reno (United States)
Sean Keely, Univ. of Nevada/Reno (United States)
Hank LeBeau, Univ. of Nevada/Reno (United States)
Gene Newman, Nevada Technical Design (United States)
Wade Cline, Univ. of Nevada/Reno (United States)

Published in SPIE Proceedings Vol. 4507:
Hard X-Ray and Gamma-Ray Detector Physics III
Ralph B. James, Editor(s)

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